Beware of the unexpected: Bimodal taint analysis
Yiu Wai Chow, Max Schäfer, Michael Pradel
Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis, pp. 211–222, 2023.
Abstract
Links
BibTeX
@inproceedings{chow2023beware,
title = {Beware of the unexpected: Bimodal taint analysis},
author = {Chow, Yiu Wai and Sch{\"a}fer, Max and Pradel, Michael},
booktitle = {Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis},
pages = {211--222},
year = {2023}
}